IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)

Identifiers

Open LibraryOL2464579A

Top Subjects

Metal oxide semiconductors, Complementary -- Congresses. (1)
Integrated circuits -- Defects -- Congresses. (1)
Iddq testing -- Congresses. (1)

Books by IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)

Total count: 1

2000 IEEE International Workshop on Defect Based TestingApril 30, 2000, Montreal, Canada : proceedings

IEEE Computer Society2000-01-01