Characterization

Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO: Application to LSI

Noboru Kimizuka, Shunpei Yamazaki, Masahiro Fujita

IWSM: 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu

[sponsored by] IEEE Electron Devices Society.

Characterization of Semiconductor Heterostructures and Nanostructures

Carlo Lamberti, Giovanni Agostini

Microscopic examination of the activated sludge process

Michael H. Gerardi ; illustrations by Brittany Lytle.

Esterification of Polysaccharides (Springer Laboratory)

Tim Liebert, Andreas Koschella, Thomas Heinze

Trace organics and inorganics in distribution and marketing municipal sludges

Rodger Baird and Sylva M. Gabrielian

IWSM: 1999 4th International Workshop on Statistical Metrology : June 12, 1999, Kyoto

technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI Symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, nformation and Communication Engineers.

Source characterization for sewage sludge incinerators final emissions report: Metropolitan Sewer District (MSD), Mill Creek Wastewater Treatment Plant, Cincinnati, Ohio

United States. Environmental Protection Agency. Emissions, Monitoring, and Analysis Division

Advanced characterization techniques for optics, semiconductors, and nanotechnologies: 3-5 August 2003, San Diego, California, USA

Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.

1997 2nd International Workshop on Statistical Metrology: IWSM, June 8, 1997, Kyoto

sponsored by IEEE Electron Devices Society ; in cooperation with Japan Society of Applied Physics ... [et al.].