P-polarized reflectance spectroscopy
a high sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions
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Author
Contributions
- Bachmann, Klaus J. - Contributor
- United States. National Aeronautics and Space Administration. - Contributor
Publication
1995 - National Aeronautics and Space Administration, [Washington, D.C, District of Columbia
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Physical Format
Microform
Identifiers
- OCLC Control Number34603011
- Open LibraryOL17078505M
Subjects
Series Statement
- [NASA contractor report] -- NASA CR-199715.
Other Editions
- P-polarized reflectance spectroscopy
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