Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
January 28-30, 1997, Four Seasons Hotel, Austin, TX, USA.
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Author
Contributions
- IEEE Components, Hybrids, and Manufacturing Technology Society. - Contributor
Publication
1997 - Institute of Electrical and Electronics Engineers, New York, New York (State)
Language
English
Word Count
72,750 words, Guess
Page Count
291 pages
Identifiers
- ISBN-10078033793X
- ISBN-100780337948
- ISBN-100780337956
- ISBN-139780780337930
- ISBN-139780780337947
and 4 more
- ISBN-139780780337954
- Goodreads6758938
- OCLC Control Number39374175
- Open LibraryOL21857702M
Alternate Titles
- 1997 IEEE 13th Annual Semiconductor Thermal Measurement and Management Symposium
- Semiconductor Thermal Measurement and Management Symposium
Subjects
Topics
Genres
- Congresses
Other Editions
- Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
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