Electron and ion microscopy and microanalysis
principles and applications
2nd ed., rev. and expanded.
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Author
Publication
1991 - M. Dekker, New York, New York (State)
Language
English
Word Count
209,250 words, Guess
Page Count
837 pages
Identifiers
- Open LibraryOL1541448M
- ISBN-100824785568
- OCLC Control Number48139870
- OCLC Control Number23974033
- OCLC Control Numberelectronionmicro0000murr
and 1 more
- Library of Congress Control Number91020173
Classifications
- DDC502/.8/25
- LCCQH212.E4 M87 1991
Subjects
Topics
Series Statement
- Optical engineering ;
Other Editions
- Electron and ion microscopy and microanalysis
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