IEEE standard for information technology -- Test methods specifications for measuring conformance to POSIX.
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Contributions
- Institute of Electrical and Electronics Engineers. - Contributor
- IEEE Standards Board. - Contributor
- IEEE Standards Association. - Contributor
- IEEE Computer Society. Portable Applications Standards Committee. - Contributor
Publication
2000 - Institute of Electrical and Electronics Engineers, New York, New York (State)
Language
English
Word Count
92,500 words, Guess
Page Count
370 pages
Identifiers
- Internet Archiveieeestdverilogha00libg_596
- ISBN-100738119709
- ISBN-100738119717
- ISBN-139780738119700
- ISBN-139780738119717
and 2 more
- OCLC Control Number50141756
- Open LibraryOL21086114M
Alternate Titles
- Test methods specifications for measuring conformance to POSIX.
- Test methods for POSIX, Part 1, Amendment 1.
- Realtime extension (C language)
- IEEE Std 2003.1b-2000.
Description
"This standard defines the test method specifications for IEEE Std 1003.1b-1993 (based on the document corresponding to the merger of IEEE Std 1003.1-1990 and IEEE Std 1003.1b-1993). The test method specifications consist of assertions to be tested and related test procedures. As an amendment to IEEE Std 1003.1-1990, this standard is structured to amend those portions of IEEE Std 2003.1-1992 (4) (the test method specification for IEEE Std 1003.1-1990) that correspond to the amended parts of IEEE Std 1003.1-1990. This standard is aimed primarily at providers of test methods for IEEE Std 1003.1b-1993 and at implementers of IEEE Std 1003.1b-1993."
Subjects
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