Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
a Laboratory Workbook
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Author
Contributions
- Goldstein, Joseph I. - Contributor
- Romig, Alton D. - Contributor
- Echlin, Patrick - Contributor
- Joy, David C. - Contributor
- Newbury, Dale E. - Contributor
and 5 more
- Williams, David B. - Contributor
- Armstrong, John T. - Contributor
- Fiori, Charles E. - Contributor
- Lifshin, Eric - Contributor
- Peters, Klaus-Ruediger - Contributor
Publication
1990 - Springer US, Boston, MA, Massachusetts
Language
English
Word Count
105,000 words, Guess
Page Count
420 pages
Physical Format
Electronic resource
Identifiers
- Internet Archivescanningelectron00lyma
- ISBN-101461306353
- ISBN-139781461306351
- OCLC Control Number840281051
- Better World Books9781461306351
and 1 more
- Open LibraryOL27086330M
Classifications
- DDC571.8
- LCCQH491
- LCCQH491-492
Subjects
Links
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