Physics of SiO2 and Its Interfaces
Proceedings of the International Topical Conference on the Physics of SiO2 and Its Interfaces Held at the IBM Thomas J. Waston Research Center, Yorktown Heights, New York, March 22-24 1978
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Author
Publication
2013 - Elsevier Science & Technology Books
Language
English
Word Count
122,000 words, Guess
Page Count
488 pages
Identifiers
- ISBN-139781483139005
- ISBN-10148313900X
- Better World Books9781483139005
- Open LibraryOL40434425M
Classifications
- LCCQC585.75.S55 I57 20
Subjects
Other Editions
- Physics of SiO2 and Its Interfaces
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