Recent developments in thin film research
epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
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Author
Contributions
- Ritter, G. - Contributor
- Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures (1997 : Strasbourg, France) - Contributor
Publication
1997 - Elsevier, Amsterdam, Netherlands
Language
English
Word Count
69,750 words, Guess
Page Count
279 pages
Identifiers
- ISBN-100444205136
- ISBN-139780444205131
- Goodreads6089856
- Library of Congress Control Number98222597
- OCLC Control Number40562424
and 2 more
- Better World Books9780444205131
- Open LibraryOL491302M
Classifications
- DDC621.3815/2
- LCCTA418.9.T45 S94 1997
- LCCTA418.9.T45S94 1997
Alternate Titles
- Epitaxial thin film growth and nanostructures
- Recent developments in electron microscopy and X-ray diffraction of thin film structures
Subjects
Genres
- Congresses
Series Statement
- European Materials Research Society symposia proceedings ;
- v. 69
Other Editions
- Recent developments in thin film research: epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
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