Fundamentals of surface and thin film analysis
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Author
Contributions
- Mayer, James W., 1930- - Contributor
Publication
1986 - North-Holland, New York, New York (State)
Language
English
Word Count
88,000 words, Guess
Page Count
352 pages
Identifiers
- Open LibraryOL2709820M
- Internet Archiveisbn_0444009892
- Internet Archivefundamentalsofsu0000feld
- ISBN-100444009892
- ISBN-139780444009890
Classifications
- DDC530.4/1
- LCCQD506 .F39 1986
- LCCQD506.F39 1986
Subjects
Topics
AnalysisSurfacesThin filmsQd506 .f39 1986bThin films--analysisSurfaces (Technology)Thin films -- AnalysisSurfaces (technology)--analysisSurfaces (Technology) -- Analysis
Other Editions
- Fundamentals of surface and thin film analysis
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