Osnovy analiza poverhnosti i tonkih plenok
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Author
Contributions
- Mayer, James W. (1930- ). - Contributor
- Belošickij, V. V. Red - Contributor
Publication
1989 - Mir, Moskva, Russia (Federation)
Language
Russian
Word Count
85,500 words, Guess
Page Count
342 pages
Identifiers
- Internet Archiveisbn_5030010173
- ISBN-105030010173
- ISBN-139785030010175
- OCLC Control Number750953861
- Open LibraryOL27049094M
Alternate Titles
- Fundamentals of surface and thin film analysis
Subjects
Topics
AnalizaWarstwy cienkie (fizyka)Powierzchnie (technologia)
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