Three-dimensional X-ray diffraction microscopy

Description

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing. The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Subjects

Series Statement

• Springer tracts in modern physics,

Other Editions

• Three-dimensional X-ray diffraction microscopy: mapping polycrystals and their dynamicsSpringer2004-01-01
• Three-Dimensional X-Ray Diffraction MicroscopySpringer Berlin / Heidelberg2013-01-01
• Three-Dimensional X-Ray Diffraction MicroscopyPaperbackSpringer2014-03-12