1998 IEEE International Integrated Reliability Workshop final report
Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
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Author
Contributions
- IEEE Electron Devices Society. - Contributor
- IEEE Reliability Society. - Contributor
Publication
1998 - IEEE Electron Devices Society, Piscataway, New Jersey, New Jersey
Language
English
Word Count
35,000 words, Guess
Page Count
140 pages
Identifiers
- Open LibraryOL396821M
- ISBN-100780348818
- OCLC Control Number40670900
- OCLC Control Number1998ieeeinternat0000inte
- Library of Congress Control Number98084868
and 1 more
- Goodreads1912747
Classifications
- DDC621.3815
- LCCTK7874 .I5944 1998
Subjects
Topics
Genres
- Congresses.
Other Editions
- 1998 IEEE International Integrated Reliability Workshop final report: Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998
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