Author

Publication

2011 - Wiley & Sons, Incorporated, John

Language

English

Word Count

74,000 words, Guess

Page Count

296 pages

Identifiers

  • ISBN-139781119978855
  • ISBN-101119978858
  • Better World Books9781119978855
  • Open LibraryOL29079986M

Description

"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--

Subjects

Other Editions

  • Aberration-Corrected Analytical Transmission Electron MicroscopyWiley & Sons, Incorporated, John2011

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