X-Ray Diffraction by Disordered Lamellar Structures
Theory and Applications to Microdivided Silicates and Carbons
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Author
Contributions
- Tchoubar, Cyril - Contributor
Publication
1990 - Springer Berlin Heidelberg, Berlin, Heidelberg, Germany
Language
English
Word Count
92,750 words, Guess
Page Count
371 pages
Physical Format
Electronic resource
Identifiers
- Internet Archivexraydiffractionb00drit
- ISBN-10364274804X
- ISBN-103642748023
- ISBN-139783642748042
- ISBN-139783642748028
and 4 more
- OCLC Control Number851731699
- Better World Books9783642748042
- Better World Books9783642748028
- Open LibraryOL27096527M
Classifications
- DDC549
- LCCQE351-399.2
- LCCQE1-996.5QE351-399.2
Description
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
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