Advances in Metrology for X-Ray and EUV Optics II
30 August 2007, San Diego, California, USA
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Word Count
42,000 words, Guess
Page Count
168 pages
Identifiers
- ISBN-139780819468529
- ISBN-100819468525
- Library of Congress Control Number2009281699
- OCLC Control Number182860020
- Better World Books9780819468529
and 1 more
- Open LibraryOL28445089M
Classifications
- LCCQC367.A335 2007
- LCCQC367 .A335 2007
- LCCQC367 .A338 2007
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