Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
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Author
Contributions
- Choi, G. - Contributor
- Iyer, Ravishankar K. - Contributor
- United States. National Aeronautics and Space Administration. Scientific and Technical Information Division. - Contributor
Publication
1990 - National Technical Information Service, distributor], Washington, DC, District of Columbia
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Physical Format
Microform
Identifiers
- Open LibraryOL18077194M
Alternate Titles
- Analog digital simulation of transient induced logic errors and upset susceptibility of an advanced control system.
Subjects
Topics
Latch-upError analysisFault toleranceLogic programmingAnalog simulationDigital simulationSingle event upsets
Series Statement
- NASA technical memorandum -- 4241.
Other Editions
- Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
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