Reliability, packaging, testing, and characterization of MEMS/MOEMS VII
21-22 January 2008, San Jose, California, USA
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Author
Contributions
- Society of Photo-optical Instrumentation Engineers - Contributor
- Boston University. Photonics Center - Contributor
Publication
2008 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-100819470597
- ISBN-139780819470591
- Library of Congress Control Number2010293880
- OCLC Control Number229155464
- Better World Books9780819470591
and 1 more
- Open LibraryOL25059796M
Classifications
- LCCTK7875 .R438 2008
- LCCTK7875.R438 2008
Alternate Titles
- Reliability, testing and characterization of MEMS/MOEMS VI.
Series Statement
- Proceedings of SPIE -- v. 6884
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 6884.
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