Trace analysis of semiconductor materials.
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Author
Publication
1964 - Pergamon Press; [distributed in the Western Hemisphere by Macmillan, New York], Oxford, England
Language
English
Word Count
70,500 words, Guess
Page Count
282 pages
Identifiers
- Open LibraryOL5886447M
- OCLC Control Number1100371
- OCLC Control Numbertraceanalysisofs0002cali
- Library of Congress Control Number63018922
Classifications
- DDC541.377
- LCCQD939 .C26 1964
Subjects
Series Statement
- International series of monographs on analytical chemistry,
Other Editions
- Trace analysis of semiconductor materials.
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