Radiation Effects on Embedded Systems
1 edition
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Author
Contributions
- Raoul Velazco (Editor) - Contributor
- Pascal Fouillat (Editor) - Contributor
- Ricardo Reis (Editor) - Contributor
Publication
2007-05-25 - Springer
Language
English
Word Count
67,250 words, Guess
Page Count
269 pages
Physical Format
Hardcover
Identifiers
- Internet Archiveradiationeffects00vela
- Internet Archiveradiationeffects00vela_438
- ISBN-101402056451
- ISBN-139781402056451
- Library of Congress Control Number2007465768
and 3 more
- OCLC Control Number74968117
- Better World Books9781402056451
- Open LibraryOL11634230M
Classifications
- LCCTK7895.E42 R33 2007
- LCCTK7867-7867.5
Subjects
Topics
ElectricityFault TolerancemicroelectronicsRadiation EffectsIntegrated circuitsScience/Mathematicssingle event effectsCircuits & componentsEffect of radiation onTechnology & EngineeringTechnology : ElectricityRadiation ground testingEmbedded computer systemsTechnology & Industrial ArtsElectronics - MicroelectronicsData security & data encryptionElectronics - Circuits - GeneralEngineering - Electrical & ElectronicTechnology : Electronics - MicroelectronicsTechnology / Electronics / Circuits / GeneralNuclear chemistry, photochemistry & radiation
Other Editions
- Radiation Effects on Embedded Systems
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