IEEE trial-use standard for test equipment description language (TEDL)
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Contributions
- IEEE Standards Board. IEEE SCC20 Test Equipment Description Subcommittee. - Contributor
Publication
1990 - Institute of Electrical and Electronics Engineers, New York, NY, New York (State)
Language
English
Word Count
0 words, Guess
Page Count
0 pages
Identifiers
- ISBN-101559370297
- ISBN-139781559370295
- Library of Congress Control Number90055419
- OCLC Control Number22338549
- Open LibraryOL20525988M
Subjects
Topics
TestingStandardsData processingAutomatic test equipmentATLAS (Computer program language)Electronic apparatus and appliancesATLAS (Computer program language) -- StandardsElectronic apparatus and appliances -- Testing -- Data processing
Series Statement
- IEEE std -- 993-1990.
Links
Other Editions
- IEEE trial-use standard for test equipment description language (TEDL)
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