Automated Technology for Verification and Analysis
Third International Symposium, ATVA 2005, Taipei, Taiwan, October 4-7, 2005, Proceedings (Lecture Notes in Computer Science)
1 edition
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Author
Contributions
- Doron A. Peled (Editor) - Contributor
- Yih-Kuen Tsay (Editor) - Contributor
Publication
2005-10-26 - Springer
Language
English
Word Count
126,500 words, Guess
Page Count
506 pages
Physical Format
Paperback
Identifiers
- Open LibraryOL9699417M
- ISBN-139783540292098
- ISBN-103540292098
- OCLC Control Number61766584
- OCLC Control Numberautomatedtechnol00tsay
and 2 more
- Library of Congress Control Number2005932760
- Goodreads5007301
Classifications
- LCCQA76.9.A96 A82 2005
Subjects
Topics
Other Editions
- Automated Technology for Verification and Analysis: Third International Symposium, ATVA 2005, Taipei, Taiwan, October 4-7, 2005, Proceedings (Lecture Notes in Computer Science)
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