Long-Term Reliability of Nanometer VLSI Systems
Modeling, Analysis and Optimization
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Publication
2020 - Springer International Publishing AG
Language
English
Word Count
115,000 words, Guess
Page Count
460 pages
Identifiers
- ISBN-139783030261740
- ISBN-103030261743
- Better World Books9783030261740
- Open LibraryOL37317665M
Classifications
- LCCTK7867-7867.5
Subjects
Other Editions
- Long-Term Reliability of Nanometer VLSI Systems
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