High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip
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Author
Publication
2017 - Springer Singapore Pte. Limited
Language
English
Word Count
54,250 words, Guess
Page Count
217 pages
Identifiers
- ISBN-139789811010729
- ISBN-109811010722
- Better World Books9789811010729
- Open LibraryOL37262884M
Classifications
- LCCTK7867-7867.5
Subjects
Other Editions
- High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip
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