Defects in SiO₂ and related dielectrics
science and technology
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Author
Contributions
- Pacchioni, G. 1954- - Contributor
- Skuja, L. - Contributor
- Griscom, David L. - Contributor
- NATO Advanced Study Institute on Defects in SiOb2s and Related Dielectrics: Science and Technology( 2000 : Erice, Italy) - Contributor
Publication
2000 - Kluwer Academic Publishers, Dordrecht, Netherlands, Netherlands
Language
English
Word Count
156,000 words, Guess
Page Count
624 pages
Identifiers
- Internet Archivedefectssiosubcla00wrig
- Internet Archivedefectssiosubcla00wrig_795
- ISBN-100792366859
- ISBN-100792366867
- ISBN-139780792366850
and 4 more
- ISBN-139780792366867
- Goodreads2732234', '5692671
- Better World Books9780792366867
- Open LibraryOL22434608M
Classifications
- DDC548/.85
- LCCQD181.S6 D43 2000
- LCCTA418.5-.84
Subjects
Topics
SilicaDefectsCrystalsCongressesCrystals, defectsElectric propertiesCrystals -- Defects -- CongressesSilica -- Electric properties -- Congresses
Genres
- Congresses
Series Statement
- NATO science series -- vol. 2
Other Editions
- Defects in SiO₂ and related dielectrics: science and technology
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