VLSI test principles and architectures
design for testability
Our rough guess is there are 194,250 words in this book.
At a pace averaging 250 words per minute, this book will take 12 hours and 57 minutes to read. With a half hour per day, this will take 26 days to read.
How long will it take you?
This book will take an estimated to read at a reading speed averaging words per minute. With 30 minutes per day, this will take to read.
Enter your reading speedYou can take one of our WPM reading speed tests to find your reading speed.
Create a free account to track your reading progress, build your reading list, and set reading goals.
Contributions
- Wang, Laung-Terng - Contributor
- Wu, Cheng-Wen, EE Ph. D - Contributor
- Wen, Xiaoqing - Contributor
Publication
2006 - Elsevier Morgan Kaufmann Publishers, Amsterdam, Netherlands
Language
English
Word Count
194,250 words, Guess
Page Count
777 pages
Identifiers
- Internet Archivevlsitestprincipl00wang_005
- Internet Archivevlsitestprincipl00wang_909
- ISBN-100123705975
- ISBN-139780123705976
- LibraryThing8722884
and 6 more
- Goodreads941344
- Library of Congress Control Number2006006869
- OCLC Control Number64624834
- OCLC Control Number434023516
- Better World Books9780123705976
- Open LibraryOL17200223M
Classifications
- LCCTK7874.75 .V587 2006
- LCCTK7874.75.V587 2006
Subjects
Other Editions
- VLSI test principles and architectures: design for testability
Reader Reviews
No reviews yet for this book.
Be the first to share your thoughts!