CMOS gate-stack scaling-- materials, interfaces and reliability implications
symposium held April 14-16, 2009, San Francisco, california, U.S.A.
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Author
Contributions
- Materials Research Society. Meeting - Contributor
- Symposium C, "CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications" (2009 : San Francisco, Calif.) - Contributor
Publication
2009 - Materials Research Society, Warrendale, Pa, Pennsylvania
Language
English
Word Count
44,750 words, Guess
Page Count
179 pages
Identifiers
- ISBN-101605111287
- ISBN-139781605111285
- Library of Congress Control Number2011294341
- OCLC Control Number505804375
- Better World Books9781605111285
and 1 more
- Open LibraryOL25177911M
Classifications
- LCCTK7871.99.M44 C5725 2009
- LCCTK7871.99.M44 C5725
Subjects
Series Statement
- MRS proceedings -- v. 1155
- Materials Research Society symposia proceedings -- v. 1155.
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