VLSI Test Principles and Architectures
Design for Testability (Systems on Silicon)
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Publication
2006-07-07 - Morgan Kaufmann
Language
English
Word Count
202,000 words, Guess
Page Count
808 pages
Physical Format
Hardcover
Identifiers
- Internet Archivevlsitestprincipl00wang_005
- Internet Archivevlsitestprincipl00wang_909
- Internet Archivevlsitestprincipl00wang
- ISBN-100123705975
- ISBN-139780123705976
and 3 more
- Goodreads941344
- LibraryThing8722884
- Open LibraryOL9282060M
Subjects
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