Purity control of semiconductors by the method of capacitance transient spectroscopy
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Author
Publication
1995 - Electronic Integral Systems, St. Petersburg, Russia (Federation)
Language
English
Word Count
28,250 words, Guess
Page Count
113 pages
Identifiers
- Open LibraryOL18723115M
Classifications
- LCCTK7871.85 .B396 1995
Subjects
Topics
SpectraSemiconductorsQuality controlImpurity distributionSemiconductors -- SpectraSemiconductors -- Quality controlSemiconductors -- Impurity distribution
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