Optical metrology for industrialization of optical information processing
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Author
Contributions
- Wilson, C. L. 1942- - Contributor
- National Institute of Standards and Technology (U.S.) - Contributor
Publication
1997 - U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, Gaithersburg, MD, Maryland
Language
English
Word Count
3,000 words, Guess
Page Count
12 pages
Physical Format
Microform
Identifiers
- OCLC Control Number39138979
- Open LibraryOL13623040M
Classifications
- LCCTA1637 .C37
Subjects
Series Statement
- NISTIR -- 6060
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