Das Transportverhalten heisser Elektronen an Metall-Halbleiterkontakten untersucht mit Ballistische-Elektronen-Emissions-Mikroskopie (BEEM)
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Contributions
- Freie Universität Berlin - Contributor
Publication
1993 - , Germany
Language
German
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Identifiers
- OCLC Control Number46172457
- Open LibraryOL57030262M
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