IEEE trial-use standard for artificial intelligence and expert system tie to automatic test equipment (AI-ESTATE)
overview and architecture
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Contributions
- IEEE Standards Coordinating Committee 20. - Contributor
Publication
1996 - Institute of Electrical and Electronics Engineers, New York, New York (State)
Language
English
Word Count
6,250 words, Guess
Page Count
25 pages
Identifiers
- ISBN-101559375655
- ISBN-139781559375658
- OCLC Control Number35646814
- Open LibraryOL20050639M
Alternate Titles
- Trial-use standard for artificial intelligence and expert system tie to automatic test equipment (AI-ESTATE)
Subjects
Topics
Series Statement
- IEEE Std -- 1232-1995.
Links
Other Editions
- IEEE trial-use standard for artificial intelligence and expert system tie to automatic test equipment (AI-ESTATE): overview and architecture
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