Sixteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium
March 21-23, 2000, DoubleTree Hotel, San Jose, CA, USA
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Author
Contributions
- IEEE Components, Hybrids, and Manufacturing Technology Society. - Contributor
Publication
2000 - IEEE, Piscataway, New Jersey, New Jersey
Language
English
Word Count
74,500 words, Guess
Page Count
298 pages
Identifiers
- ISBN-10078035916X
- ISBN-100780359178
- ISBN-100780359186
- ISBN-139780780359161
- ISBN-139780780359178
and 4 more
- ISBN-139780780359185
- Goodreads1948635
- OCLC Control Number43917322
- Open LibraryOL19020281M
Alternate Titles
- Semiconductor Thermal Measurement and Management Symposium
- SEMI-THERM proceedings 2000
Subjects
Topics
CoolingCongressesElectricitySemiconductorsThermal propertiesScience/MathematicsEngineering (General)Technology & EngineeringTechnology & Industrial ArtsSemi-conductors & super-conductorsEngineering - Electrical & ElectronicSemiconductors -- Cooling -- CongressesSemiconductors -- Thermal properties -- Congresses
Genres
- Congresses
Other Editions
- Sixteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium: March 21-23, 2000, DoubleTree Hotel, San Jose, CA, USA
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