International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th 1999 Singapore)

Identifiers

Open LibraryOL6368261A

Top Subjects

Integrated circuits -- Testing -- Congresses (1)
Integrated circuits -- Defects -- Congresses (1)

Books by International Symposium on the Physical & Failure Analysis of Integrated Circuits (7th 1999 Singapore)

Total count: 1

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '995-9 July, 1999, Orchard Hotel, Singapore]

IEEE1999-01-01