Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99
5-9 July, 1999, Orchard Hotel, Singapore]
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Author
Contributions
- Chim, Wai Kin. - Contributor
- Radhakrishnan, M. K. - Contributor
- Thong, John. - Contributor
- IEEE Reliability/CPMT/ED Singapore Chapter. - Contributor
Publication
1999 - IEEE, Piscataway, New Jersey, New Jersey
Language
English
Word Count
52,250 words, Guess
Page Count
209 pages
Identifiers
- ISBN-100780351878
- ISBN-100780351886
- ISBN-139780780351875
- ISBN-139780780351882
- Goodreads351885', '3213187
and 1 more
- Open LibraryOL21918296M
Classifications
- LCCTK7874 .I47377 1999
Alternate Titles
- IPFA '99 proceedings
- Physical & failure analysis of integrated circuites
- 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
- IPFA '99
Subjects
Genres
- Congresses
Other Editions
- Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99: 5-9 July, 1999, Orchard Hotel, Singapore]
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