Instrumentation, metrology, and standards for nanomanufacturing II
10 August 2008, San Diego, California, USA
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Author
Contributions
- Society of Photo-optical Instrumentation Engineers - Contributor
- National Institute of Standards and Technology (U.S.) - Contributor
Publication
2008 - SPIE, Bellingham, Wash, Washington (State)
Language
English
Word Count
50,000 words, Guess
Page Count
200 pages
Identifiers
- ISBN-10081947262X
- ISBN-139780819472625
- Library of Congress Control Number2010455186
- OCLC Control Number263421656
- Better World Books9780819472625
and 1 more
- Open LibraryOL24429815M
Classifications
- DDC620/.5
- LCCTA418.9.N35 I567 2008
- LCCTA418.9.N35I567 2008
Series Statement
- Proceedings of SPIE -- v. 7042
- Proceedings of SPIE--the International Society for Optical Engineering -- v. 7042.
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